Laboratories Developed
  1. Laser Speckles
  2. Core diameter measurement using laser speckles
  3. Projection Moire technique for shape measurement
  4. Measurement of diffraction efficiency
  5. Modulating a laser beam

Directed Research
  1. Error analysis in laser speckle photography
  2. Investigation of a biological specimen using ESPI
  3. Theory on the contrast of the fringes in a single beam laser speckle analysis
  4. Fiber core diameter measurement using laser speckles
  5. Random dots for 3-D images
  6. Schologram method to create 3-D images
  7. Detection of glucose level using speckles
  8. Simple method of detecting the statistical properties of laser speckles

Masters Thesis
  1. Fiber optic Electronic Speckle Pattern Interferometric system with a 1550 nm laser diode, Christopher Orcutt, (1994)
  2. "Increasing in-plane displacement sensitivity in ESPI", Thesis, Alexander Sohmer, (1995)
  3. "Electronic Speckle Shearing Pattern Interferometry using Holographic Grating", Thesis, Lutz Buerkle, (1995)

REFEREED PAPERS PUBLISHED:
  1. Speckle shear interferometry by double dove prism, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Optics commun.,14, 27-30 [1983]
  2. Measurement of tilt with speckle shear interferometry, R.K.Mohanty, C. Joenathan and R.S.Sirohi, J.Optics (INDIA), 12, 118-122 [1983]
  3. Multiplexing in speckle shear interferometry, C. Joenathan, R.K.Mohanty and R.S.Sirohi, Optica Acta, 31, 681-692 [1984]
  4. Speckle interferometric method of measuring small out-of-plane displacements, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Optics Letters, 9, 475-477 [1984]
  5. Speckle fringe sharpening in speckle interferometry, R.K.Mohanty, C. Joenathan and R.S.Sirohi, J.Optics (INDIA), 13, 49-51 [1984]
  6. On the methods of multiplexing in speckle shear interferometry, C. Joenathan, R.K.Mohanty and R.S.Sirohi, Optik, 69, 8-12 [1984]
  7. Fringe sharpening and information coupling in speckle shear interferometry, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Applied Optics, 23, 4596-4600 [1984]
  8. Contouring by speckle interferometry, C. Joenathan, R.K.Mohanty and R.S.Sirohi, Optics Letters, 10, 579-581
  9. Hololens in speckle and speckle shear interferometry, C. Joenathan, R.K.Mohanty and R.S.Sirohi, Applied Optics, 24, 1294-98 [1985]
  10. Curvature by halo combination in speckle shear interferometry, C. Joenathan, R.K.Mohanty and R.S.Sirohi, J.Optics (INDIA), 13, 114-119 [1985]
  11. Multiplexing in speckle shear interferometry: an optimal method, R.K.Mohanty, C.Joenathan and R.S.Sirohi, Applied Optics, 24, 2043-2044 [1985]
  12. Speckle and speckle shear interferometry combined for the simultaneous determination of out-of-plane displacement and slope, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Applied Optics, 24, 3106-3109 [1985]
  13. Holographic grating in speckle shear interferometry, C. Joenathan and R.S.Sirohi, Applied Optics, 24, 2750-51 [1985]
  14. NDT by speckle rotational shear interferometry, R.K.Mohanty, C. Joenathan and R.S.Sirohi, NDT international, 18, 203-205 [1985
  15. Power spectral density of a subjective speckle pattern, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Applied Optics, 25, 595 [1986]
  16. Enhancement of sensitivity in in-plane displacement measurement in speckle photography, C.Joenathan and R.S.Sirohi, Applied Optics, 25, 1380-81 [1986]
  17. Elimination of error in speckle photography, C. Joenathan and R.S.Sirohi, Applied Optics, 25, 1791-94 [1986]
  18. Fringe compensation in speckle interferometry: Application to NDT, C. Joenathan, A.R.Ganesan and R.S.Sirohi, Applied Optics, 25, 3781-84 [1986]
  19. Multiplexing in speckle interferometry: some methods, C. Joenathan and R.S.Sirohi, J.Optics (INDIA), 15, 39-47 [1986]
  20. Radial and rotational slope contours in speckle shear interferometry, C. Joenathan, C.S.Narayanamurthy and R.S.Sirohi, Optics comn., 56, 309-312 [1986]
  21. High sensitivity tilt measurement by speckle shear interferometry, R.K.Mohanty, C.Joenathan and R.S.Sirohi, Applied Optics, 25, 1661-64 [1986]
  22. Multiple image subtraction by speckle interferometry, V.V.Rao, C. Joenathan and R.S.Sirohi, J.Optics (PARIS), 17, 147-151 [1986]
  23. Comparative speckle interferometry: an improvement, C.S.Narayanamurthy, C. Joenathan and R.S.Sirohi, Optik, 75, 142-145 [1987]
  24. Application of multi-aperture white light speckle photography, N.K.Mohan, C. Joenathan, D.K.Sharma and R.S.Sirohi, Optik, 76, 7-11 [1987]
  25. Narrow slit aperture white light speckle photography for non destructive testing, N.K.Mohan, C. Joenathan and R.S.Sirohi, Optics Commun., 64, 229-233 [1987]
  26. Real time comparative digital speckle pattern interferometry, A.R.Ganesan, C. Joenathan and R.S.Sirohi, Optics Commun., 64, 501-506 [1987]
  27. Speckle pattern fringes produced by longitudinal motion of the diffuse object: sensitivity dependence and multiple exposures, C.S.Narayanamurthy and C. Joenathan, Optics commun.,65, 179-184 [1988]
  28. Investigations on multi-aperture white light speckle photography, N.K.Mohan, C. Joenathan and R.S.Sirohi, Optics Commun., 67, 27-33 [1988]
  29. Localization of fringes in speckle photography due to axial motion of the diffuse object, C.Joenathan, C.S.Narayanamurthy and R.S.Sirohi, J.Opt.Soc.Am.A, 5, 1035-40 [1988]
  30. Sharpening of fringes in digital speckle pattern interferometry, A.R.Ganesan, C. Joenathan and R.S.Sirohi, Applied Optics, 27, 2099-2100 [1988]
  31. Verfahren zur Relativpruefung optischer Komponenten mittels Speckle-Messtechnik, C.Joenathan and H.J.Tiziani, Submitted for patent, July 1989, West Germany
  32. Separation of rotation and longitudinal motion of the diffuse object, C.S.Narayanamurthy, C. Joenathan and R.S.Sirohi, Indian J. of Pure and Applied Physics, 27, 212-216 [1989]
  33. Digitale Speckle-Interferometrie zur Kontourlinien - und Phasenobjektvermessung, C.Joenathan, R.Torroba, B.Pfister and H.J.Tiziani, Jahresbericht, Universtaetspresse, Ed.Tiziani, 95-98 [1989]
  34. Contouring by electronic speckle pattern interferometry employing a dual beam illumination, C. Joenathan, B.Pfister and H.J.Tiziani, Applied Optics, 29, 1905-1911 [1990]
  35. Effect of non-linearity of the TV camera in electronic speckle pattern interferometry, C.Joenathan, Optik, 85, 33-37 [1990]
  36. Simple electronic speckle shearing pattern interferometer, C. Joenathan and R.Torroba, Optics letters, 15, 1159-1161 [1990]
  37. Development of a fiber optic interferometric sensor using diode laser, D.Brewer, C.Joenathan, Y. Wang and B.M.Khorana, Poc.SPIE, 1396, 430-434 [1990]
  38. Fiber optic phase measuring electronic speckle pattern interferometer, C. Joenathan and B.M.Khorana, Proc.SPIE, 1396, 155-163 [1990],
  39. Error in speckle photography: effect of coherent and incoherent speckles, C. Joenathan, Optik (Germany) 87, 179-183 [1991]
  40. Modified electronic speckle pattern interferometry employing an off-axis reference beam, C. Joenathan and R.Torroba, Applied Optics, 30, 1169-1171 [1991]
  41. Real time refractive index measurement by ESPI, C. Joenathan and R.Torroba, LAMP series report, Int. Center for Theoretical Physics, 1, 1-15 [1991]
  42. A simple and modified ESPI system, C. Joenathan and B.M.Khorana, Optik (Germany) 88, 169-171 [1991]
  43. Vibration fringes by phase stepping on an electronic speckle pattern interferometer: an analysis, C. Joenathan, Applied Optics, 30, 4658-4665 [1991]
  44. Recent developments in Electronic Speckle Pattern Interferometry, C. Joenathan, Proc. SEM, 198-204 [1991]
  45. Design review of an infrared phase-shifting interferometer, P.R.De Stafano, A.B.Western, H.P.Stahl, and C. Joenathan, SPIE, 1779, 35-46 [1992]
  46. Phase measurement by differentiating interferometric fringes, C. Joenathan and B.M.Khorana, Journal of Modern Optics, 39, 2075-87 [1992]
  47. Contrast of the vibration fringes in time-averaged ESPI: Effect of speckle averaging, C.Joenathan and B.M.Khorana, Applied Optics, 31, 1863-1870 [1992]
  48. A quasi equal path ESPI, P.Song, C. Joenathan and B.M.Khorana, Optics Letters, 17, 1040-1042 [1992]
  49. Development of a compact phase measuring ESPI system using single mode fiber and diode laser, P.Song, C. Joenathan and B.M.Khorana, SPIE, 1779, 212-217 [1992]
  50. On the electronic speckle pattern interferometric vibration fringes, C. Joenathan and B.M.Khorana, SPIE, 1779, 230-238 [1992]
  51. Studies on the use of laser diode in a fiber optic phase measuring electronic speckle pattern interferometer, P.Song, C. Joenathan and B.M.Khorana, Communicated to Optical Engineering [1993]
  52. Vibration analysis on steel drums using ESPI, C. Joenathan, B.M.Khorana and U.W.Hansen, Acustica, 46, 97, (1992)
  53. Phase measuring fiber optic ESPI system: phase step calibration and phase drift minimization, C. Joenathan and B.M.Khorana, Optical Engineering, 31, 315-321 [1992]
  54. Phase measuring fiber optic ESPI system: phase step calibration and error sources, C.Joenathan and B.M.Khorana, Proc.SPIE, 1154, 56-63 [1992]
  55. Pulsed lasers in speckle photography: error due to pulse width, C. Joenathan, Steven Blair, and A.R.Ganesan, Applied Optics, 32, 204-209, [1993]
  56. On the quasi-equal path ESPI system, C. Joenathan and B.M.Khorana, Applied Optics, 32, 5724-5726 [1993]
  57. Multi-mode optical fiber core diameter measurement using speckle methods, D. Burton and C. Joenathan, Optik, 96, 47-48 [1994]
  58. Oblique incidence and observation electronic speckle pattern interferometry, C. Joenathan, Applied Optics 33, 7305-7311[1994]
  59. Fiber Optics Electronic Speckle Pattern Interferometric system with a 1550 nm laser diode, C. Orcutt, C Joenathan, and B. M. Khorana, Optik (Germany) , 100, 57-60 [1995].
  60. Enhancement of in-plane displacement measurement using oblique incidence ESPI, C. Joenathan, A. Sohmer, and L. Buerkle, Applied Optics, 34, 2880-2885 [1995]
  61. Some investigations on the temporal and spatial properties of the time-varying speckles of botanic specimen, X. Zijie, C. Joenathan and B. M. Khorana, Optical Engineering, 34, 1487-1502, [1995]
  62. Increasing the sensitivity by two-fold in ESPI, A. Sohmer and C. Joenathan, Optical Engineering, 35, 1943-1948 [1996]
  63. A grating Electronic speckle shear pattern interferometer, L. Buerkle and C. Joenathan, Proceeding SPIE, May [1995]
  64. Electronic speckle shearing pattern interferometry using holographic gratings, C. Joenathan and L. Buerkle, Optical Engineering, 36, 2473-2477 [1997]
  65. Speckle interferometry with temporal phase evaluation for measuring large object deformation, C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, Applied Optics, 37, 2608-2614 [1998].
  66. Large in-plane displacement measurement in dual beam speckle interferometry using temporal Fourier-transformation, C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, J. Modern Optics, 45, 1975-1984 [1998].
  67. Novel temporal Fourier transform speckle pattern shearing interferometer, C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, Optical Engineering, 37, 1790-1795 [1998]
  68. Shape measurement using temporal Fourier-transform in dual beam illumination speckle interferometry," C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, Applied Optics, 3385-3390 [1998]
  69. Non destructive testing using temporal phase evaluation in speckle interferometry, C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, In press, Experimental Mechanics [1998]
  70. Temporal Speckle Pattern Interferometry, Optics in 1998, in Optics and Photonics News, 22-23, Dec. 1998
  71. Speckleinterferometrie mit zeitichler Phasenvariation zur Messung grosser Deformationen, C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, DGAO, Germany, [1998]
  72. Speckle interferometry with temporal phase evaluation: Effect of speckle size, decorrelation and non linearity of the camera, C. Joenathan, P. Haible, and H. J. Tiziani, In press Applied Optics [1999]

BOOK CHAPTER
  1. C. Joenathan, SPECKLE PHOTOGRAPHY, ESPI AND SHEAROGRAPHY, In Handbook of Optical Metrology, Ed. P. Rastogi, Artech House, NY, London, 1998

 

BOOK REVIEW
  1. Speckle Metrology, Ed. Sirohi, Appeared in Optics and Photonics, 1994
Back to initial page