REFEREED PAPERS PUBLISHED:

  1. Speckle shear interferometry by double dove prism, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Optics commun.,14, 27-30 [1983]
  2. Speckle interferometric method of measuring small out-of-plane displacements, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Optics Letters, 9, 475-477 [1984]
  3. Speckle and speckle shear interferometry combined for the simultaneous determination of out-of-plane displacement and slope, R.K.Mohanty, C. Joenathan and R.S.Sirohi, Applied Optics, 24, 3106-3109 [1985]
  4. NDT by speckle rotational shear interferometry, R.K.Mohanty, C. Joenathan and R.S.Sirohi, NDT international, 18, 203-205 [1985
  5. Fringe compensation in speckle interferometry: Application to NDT, C. Joenathan, A.R.Ganesan and R.S.Sirohi, Applied Optics, 25, 3781-84 [1986]
  6. Comparative speckle interferometry: an improvement, C.S.Narayanamurthy, C. Joenathan and R.S.Sirohi, Optik, 75, 142-145 [1987]
  7. Shear interferometry with holographic lenses, C. Joenathan, V.Parthiban and R.S.Sirohi, Optical Engineering, 26, 359-364 [1987]
  8. Narrow slit aperture white light speckle photography for non destructive testing, N.K.Mohan, C. Joenathan and R.S.Sirohi, Optics Commun., 64, 229-233 [1987]
  9. Real time comparative digital speckle pattern interferometry, A.R.Ganesan, C. Joenathan and R.S.Sirohi, Optics Commun., 64, 501-506 [1987]
  10. Verfahren zur Relativpruefung optischer Komponenten mittels Speckle-Messtechnik, C.Joenathan and H.J.Tiziani, Submitted for patent, July 1989, West Germany
  11. Recent developments in Electronic Speckle Pattern Interferometry, C. Joenathan, Proc. SEM, 198-204 [1991]
  12. Development of a compact phase measuring ESPI system using single mode fiber and diode laser, P.Song, C. Joenathan and B.M.Khorana, SPIE, 1779, 212-217 [1992]
  13. Oblique incidence and observation electronic speckle pattern interferometry, C. Joenathan, Applied Optics 33, 7305-7311[1994]
  14. Fiber Optics Electronic Speckle Pattern Interferometric system with a 1550 nm laser diode, C. Orcutt, C Joenathan, and B. M. Khorana, Optik (Germany) , 100, 57-60 [1995].
  15. Non destructive testing using temporal phase evaluation in speckle interferometry, C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, In press, Experimental Mechanics [1998]

BOOK CHAPTER

  1. C. Joenathan, SPECKLE PHOTOGRAPHY, ESPI AND SHEAROGRAPHY, In Handbook of Optical Metrology, Ed. P. Rastogi, Artech House, NY, London, 1998
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